The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 03, 2017
Filed:
Jul. 18, 2013
Essilore International (Compagnie Generale D'optique), Charenton-le-Pont, FR;
Fabien Divo, Charenton-le-Pont, FR;
Philippe Pinault, Charenton-le-Pont, FR;
Christophe Condat, Charenton-le-Pont, FR;
Ahmed Haddadi, Charenton-le-Pont, FR;
ESSILOR INTERNATIONAL (COMPAGNIE GENERALE D'OPTIQUE), Charenton-le-Pont, FR;
Abstract
The invention relates to a method for measuring the geometric morphometric parameters of a person wearing glasses (), said method implementing an independent computing device () comprising a screen, a target (), a compact image acquisition system () which is provided with a means of determining the inclination thereof, said system () being connected to said screen, and a computer for controlling the image acquisition system () and processing the images obtained. The main feature of a measuring method according to the invention is that it comprises a step in which the person observes the target () placed in a position known to the image acquisition system (), by rolling his or her head in an upward direction while keeping his or her eyes fixed on the target ().