The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 03, 2017

Filed:

Jun. 23, 2014
Applicant:

Nidek Co., Ltd., Gamagori, Aichi, JP;

Inventors:

Ryoji Shibata, Toyokawa, JP;

Tomoji Tanaka, Okazaki, JP;

Assignee:

NIDEK CO., LTD., Aichi, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G02C 3/00 (2006.01); G02C 13/00 (2006.01); G01B 5/20 (2006.01); B24B 49/00 (2012.01); B24B 9/14 (2006.01);
U.S. Cl.
CPC ...
G02C 13/003 (2013.01); B24B 9/146 (2013.01); B24B 49/00 (2013.01); G01B 5/20 (2013.01); G02C 13/00 (2013.01);
Abstract

There is provided an eyeglass frame shape measuring apparatus includes an eyeglass frame holding unit which holds an eyeglass frame, and a measuring unit which measures a shape of a rim of the eyeglass frame by tracing a contour of the rim of the eyeglass frame. The measuring unit includes a tracing stylus which is inserted into a groove of the rim, a tracing stylus moving unit which moves the tracing stylus in a radial direction of the rim, and a rotating unit which rotates the tracing stylus moving unit about a first axis set to pass through an inside of the contour of the rim such that the tip of the tracing stylus traces the rim along the contour of the rim, and which is disposed on a rear side of the eyeglass frame held by the eyeglass frame holding unit.


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