The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 03, 2017

Filed:

May. 06, 2010
Applicant:

Pascal Desaute, Paris, FR;

Inventor:

Pascal Desaute, Paris, FR;

Assignee:

EOS IMAGING, Paris, FR;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01T 1/185 (2006.01);
U.S. Cl.
CPC ...
G01T 1/185 (2013.01);
Abstract

An X-ray detecting apparatus for the detection and localization of ionizing X-ray or gamma radiation in radiography, the apparatus comprising: an X-ray detector including: conversion means for converting incident x-ray photons of an incident x-ray photon beam into detectable electrical charges; and amplification means for amplifying the electrical charges in the detector by an non-linear amplification gain factor the non-linear amplification gain being characterized by a decrease in amplification gain at high fluxes of incident x-ray photons; and amplification gain adjustment means configured to vary the amplification gain of the amplification means according to the emission parameters of an x-ray source providing the incident x-ray photon beam for the radio-graphic examination to be performed and/or the transmitted beam received by the detector from the x-ray source via the subject being imaged. A radiographic imaging device and a method of operating the radiographic imaging device are also presented.


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