The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 03, 2017
Filed:
May. 29, 2013
Canon Kabushiki Kaisha, Tokyo, JP;
Hisafumi Ebisawa, Tokyo, JP;
Canon Kabushiki Kaisha, Tokyo, JP;
Abstract
A test-object-information acquisition apparatus includes a light radiating unit, a first probe that receives an acoustic wave generated in a test object in response to the test object being irradiated with light radiated by the light radiating unit, a second probe that radiates an ultrasound beam towards the test object and receives a reflected wave from the test object, an ultrasound controller configured to control the second probe, and a scanning unit configured to cause the light radiating unit and the first and second probes to perform a reciprocating scan process across the test object. The ultrasound controller varies a radiation method for radiating the ultrasound beam from the second probe to the test object so that the radiation method is different between an outbound scan and a return scan of the reciprocating scan process.