The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 03, 2017
Filed:
Sep. 19, 2012
Yasuhiro Kamada, Tokyo, JP;
Hikaru Hanada, Tokyo, JP;
Masahiro Takizawa, Tokyo, JP;
HITACHI, LTD., Tokyo, JP;
Abstract
In the non-Cartesian measurement, image quality is improved while the advantages of non-Cartesian measurement are maintained. To realize the aforementioned, in the non-Cartesian measurement, artifacts caused by non-uniform data density in k-space are reduced. Therefore, each unit k-space is imaged by an inverse Fourier transform, the field of view of the image is enlarged in a direction in which data density is to be increased, and the image after the enlargement of the field of view is Fourier transformed and gridded as unit k-space that has a small k-space pitch in the direction in which the field of view has been enlarged and has an increased amount of data. This processing is repeated for all blades.