The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 03, 2017

Filed:

Mar. 11, 2015
Applicant:

SK Hynix Inc., Icheon-si, Gyeonggi-do, KR;

Inventor:

Seong Ju Lee, Namyangjusi Gyeonggi-do, KR;

Assignee:

SK HYNIX INC., Icheon-Si, KR;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 31/319 (2006.01); G01R 31/30 (2006.01); G01R 31/3193 (2006.01); G01R 31/317 (2006.01); G11C 29/12 (2006.01); G11C 29/48 (2006.01);
U.S. Cl.
CPC ...
G01R 31/31924 (2013.01); G01R 31/31726 (2013.01); G01R 31/31937 (2013.01); G11C 29/1201 (2013.01); G11C 29/48 (2013.01);
Abstract

A test path compensating circuit may include a plurality of electrical paths electrically coupling a plurality of test pads to a test target circuit. The test path compensating circuit may include a control voltage generation circuit configured to generate a plurality of control voltages. The test path compensating circuit may include a plurality of voltage-control delay circuits electrically coupled to the plurality of electrical paths, respectively, and configured to control delay amounts of input test signals received from one or more of the plurality of test pads, based on one or more of the plurality of control voltages, and provide output test signals to the test target circuit.


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