The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 03, 2017

Filed:

Jan. 13, 2015
Applicant:

Bwxt Nuclear Operations Group, Inc., Lynchburg, VA (US);

Inventors:

Michael D. McAninch, Goode, VA (US);

Jeffrey J. Root, Columbus, OH (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01T 1/29 (2006.01); G01R 19/00 (2006.01); H01J 37/244 (2006.01); B23K 15/00 (2006.01);
U.S. Cl.
CPC ...
G01R 19/0061 (2013.01); B23K 15/0026 (2013.01); H01J 37/244 (2013.01); H01J 2237/24405 (2013.01); H01J 2237/24507 (2013.01); H01J 2237/3104 (2013.01);
Abstract

The present invention relates generally to the field of sensors for beam imaging and, in particular, to a new and useful beam imaging sensor for use in determining, for example, the power density distribution of a beam including, but not limited to, an electron beam or an ion beam. In one embodiment, the beam imaging sensor of the present invention comprises, among other items, a circumferential slit that is either circular, elliptical or polygonal in nature. In another embodiment, the beam imaging sensor of the present invention comprises, among other things, a discontinuous partially circumferential slit. Also disclosed is a method for using the various beams sensor embodiments of the present invention.


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