The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 03, 2017

Filed:

Oct. 29, 2009
Applicant:

Hiroyuki Tanaka, Halstenbek, DE;

Inventor:

Hiroyuki Tanaka, Halstenbek, DE;

Assignee:

SYSMEX CORPORATION, Kobe, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 35/04 (2006.01); G01N 35/02 (2006.01); G01N 35/00 (2006.01);
U.S. Cl.
CPC ...
G01N 35/00603 (2013.01); G01N 35/026 (2013.01); G01N 2035/0415 (2013.01); Y10T 436/113332 (2015.01);
Abstract

A sample processing system is disclosed that comprises: a transportation apparatus configured to convey a sample container; a first analyzer, arranged along the transportation apparatus, configured to measure a sample accommodated in a sample container conveyed by the transportation apparatus; a second analyzer, arranged along the transportation apparatus, configured to measure a sample accommodated in a sample container conveyed by the transportation apparatus; and a transportation controller configured to determine an analyzer to which a sample container is conveyed, and to control the transportation apparatus to convey the sample container to the determined analyzer, wherein: the first analyzer is configured to conduct primary measurement; and the second analyzer is configured to conduct both primary measurement and review measurement.


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