The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 03, 2017
Filed:
Nov. 18, 2013
Dynamic Systems Inc., Poestenkill, NY (US);
Andrew Greg Dorman, Poestenkill, NY (US);
Dynamic Systems Inc., Poestenkill, NY (US);
Abstract
A thermal-mechanical testing apparatus for use with an electrically conductive specimen testing system. In one embodiment, the apparatus includes a first compression anvil assembly, a mounting frame coupled to the first compression anvil assembly, and a second compression anvil assembly positioned opposite the first compression anvil assembly and the mounting frame. The first compression anvil assembly includes a mounting plate, a first compression anvil coupled to the mounting plate, and a heating current ground system coupled to the mounting plate. The mounting frame includes a set of conductive end plates, a set of insulating connectors connecting the conductive end plates, and a plurality of mounting components coupled to the insulating connectors. The mounting components are also coupled to the mounting plate. The second compression anvil assembly includes a conductive mounting plate, a second compression anvil coupled to the conductive mounting plate, and a heating current by-pass system coupled to the conductive mounting plate and one of the conductive end plates.