The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 03, 2017

Filed:

Oct. 19, 2012
Applicant:

Commissariat a L'energie Atomique ET Aux Energies Alternatives, Paris, FR;

Inventors:

Caroline Paulus, Grenoble, FR;

Joachim Tabary, Grenoble, FR;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 23/203 (2006.01); G01N 23/20 (2006.01);
U.S. Cl.
CPC ...
G01N 23/20091 (2013.01); G01N 23/203 (2013.01); G01N 23/20066 (2013.01); G01N 2223/063 (2013.01); G01N 2223/601 (2013.01);
Abstract

The invention relates to a device for identifying a material of an object having: a source of X photons and a spectrometric detector, the source irradiating the object with an incident beam and the detector measuring a magnitude of a backscattered beam from the incident beam after diffusion in a volume of the material and an energy of the X photons of the backscattered beam, the incident and backscattered beams forming an angle of diffusion (θ); a configuration for adjusting the position between the source, the detector and the object in order for the volume to be at different depths with a constant angle, a means for processing the two magnitudes in two positions and the energy in on position and for calculating an attenuation factor (μmateriau (E, E, ε)), a configuration for estimating the density (p) of the material.


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