The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 03, 2017

Filed:

Jul. 01, 2016
Applicant:

Ciencia, Inc., East Hartford, CT (US);

Inventors:

William Page, Storrs, CT (US);

George N. Gibson, Storrs, CT (US);

Ernest F. Guignon, Canton, CT (US);

Assignee:

Ciencia, Inc., East Hartford, CT (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 21/00 (2006.01); G01N 21/552 (2014.01); G02F 1/19 (2006.01);
U.S. Cl.
CPC ...
G01N 21/553 (2013.01); G02F 1/195 (2013.01);
Abstract

An instrument for measuring and analyzing surface plasmon resonance (SPR) and/or surface plasmon coupled emission on an electro-optic grating-coupled sensor surface is described herein. The sensor chip achieves SPR through a grating-coupled approach, with variations in the local dielectric constant at regions of interest (ROI) at the sensor surface detected as a function of the intensity of light reflecting from these ROI. Unlike other grating-based approaches, the metal surface is sufficiently thin that resonant conditions are sensitive to dielectric constant changes both above and below the metal surface (like the Kretschmann configuration). Dielectric constant shifts that occur as mass accumulates on the surface can be returned to reference intensities by applying voltage across the underlying electro-optic polymer. Approaches to the development of the sensor surfaces are described, as are software and hardware features facilitating sample handling, data gathering, and data analysis by this solid-state approach.


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