The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 9534963 B1

PDF
Full Text
Expired
Date of Patent:
Jan. 03, 2017

Filed:

Dec. 14, 2013
Applicant:

Huazhong University of Science and Technology, Wuhan, CN;

Inventors:

Wenzhong Liu, Wuhan, CN;

Jing Zhong, Wuhan, CN;

Ling Jiang, Wuhan, CN;

Ming Yang, Wuhan, CN;

Pu Zhang, Wuhan, CN;

Ming Zhou, Wuhan, CN;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A61B 5/01 (2006.01); G01K 7/36 (2006.01); A61B 5/05 (2006.01);
U.S. Cl.
CPC ...
G01K 7/36 (2013.01); A61B 5/01 (2013.01); A61B 5/05 (2013.01); A61B 2562/0285 (2013.01);
Abstract

Provided is a magnetic nano temperature measurement method under a triangle wave excitation magnetic field relating to a technical field of nano measurement. The method further comprises steps of: (1) positioning a magnetic nano sample at a measured object; (2) applying a triangle wave excitation magnetic field on area of the magnetic nano sample; (3) detecting a triangle wave excitation magnetic field-time curve and a magnetization-time curve of the magnetic nano sample; (4) obtaining a magnetizing curve of the magnetic nano sample, namely excitation magnetic field-magnetization curve, by the triangle wave excitation magnetic field curve and the magnetization curve, and sampling the magnetizing curve to obtain magnetization Mof the magnetic nano sample under excitation magnetic field H; and (5) determining temperature of the measured object by curve fitting with excitation magnetic field Has input, magnetization Mas output, and a relationship between the excitation magnetic field and the magnetization as objective function. The invention obtains a magnetizing curve rapidly using a triangle wave excitation magnetic field, and realizes real-time and precise temperature measurement based on magnetic nanoparticles by inversion algorithms according to the magnetizing curve based on a temperature measurement model of magnetic nanoparticles under a DC magnetic field.


Find Patent Forward Citations

Liu, Wenzhong. (2017). Magnetic nano temperature measurement method using triangle wave excitation magnetic field (U.S. Patent No. 9534963). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/9534963

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