The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 03, 2017

Filed:

Apr. 18, 2011
Applicants:

Wenshan Yu, Houston, TX (US);

Yumei Tang, Tomball, TX (US);

Michael S. Bittar, Houston, TX (US);

Inventors:

Wenshan Yu, Houston, TX (US);

Yumei Tang, Tomball, TX (US);

Michael S. Bittar, Houston, TX (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01V 1/50 (2006.01); E21B 47/00 (2012.01); G01V 3/24 (2006.01);
U.S. Cl.
CPC ...
E21B 47/00 (2013.01); G01V 1/50 (2013.01); G01V 3/24 (2013.01);
Abstract

In some embodiments, an apparatus and a system, as well as a method and an article, may operate to acquire input data to determine properties of a formation, using a combination of down hole transmitters and receivers, to select a portion of the input data using a formation model chosen from a plurality of down hole tool response models in a formation model database, based on a valid sensitive range for the bed boundary distance and a greatest signal-to-noise ratio (SNR), and to solve for at least resistivity formation parameters in the properties using the chosen formation model and the selected portion of the input data. The database may be updated with boundary distance and the resistivity formation parameters. Additional apparatus, systems, and methods are disclosed.


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