The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 03, 2017

Filed:

Apr. 25, 2012
Applicant:

Shinichiro Suzuki, Chiba, JP;

Inventor:

Shinichiro Suzuki, Chiba, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G02B 5/18 (2006.01); B42D 25/328 (2014.01); B42D 25/29 (2014.01); B42D 25/00 (2014.01);
U.S. Cl.
CPC ...
B42D 25/328 (2014.10); B42D 25/00 (2014.10); B42D 25/29 (2014.10); G02B 5/1809 (2013.01); G02B 5/1823 (2013.01); G02B 5/1828 (2013.01); G02B 5/1861 (2013.01); B42D 2035/14 (2013.01);
Abstract

A diffraction grating recording medium () that enhances the ability to prevent forgery and make security more reliable. The diffraction grating recording medium () comprises a first recording region () including viewing image unit cells (), (), () having a light diffraction structure, and a second recording region () including hidden image unit cells (). The viewing image unit cells of the first recording region () has a grating pitch more than the wavelength of visible light, and the hidden image unit cells of the second recording region () has a grating pitch less than the wavelength of visible light.


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