The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 03, 2017
Filed:
Nov. 14, 2013
Koninklijke Philips N.v., Eindhoven, NL;
Mark Douglas Herold, Stow, OH (US);
Ted Alan Bremenour, Concord, OH (US);
John Carlon, Madison, OH (US);
KONINKLIJKE PHILIPS N.V., Eindhoven, NL;
Abstract
Described herein is an approach to determine a deflection of a portion of an imaging system tabletop located at iso-center utilizing a tabletop deflection determiner with a least a first portion located on a rotating gantry portion of the imaging system. In one non-limiting instance, an imaging system includes a rotating gantry portion () with an aperture defining an examination region, a tabletop () that supports a subject or object in the examination region, wherein the tabletop cantilevers into and deflects in the examination region, and a tabletop deflection determiner () that determines a deflection of the tabletop in the examination region, wherein a first portion () of the tabletop deflection determiner is located on the rotating gantry portion.