The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 27, 2016
Filed:
May. 30, 2012
Applicants:
Anurag Singla, Cupertino, CA (US);
Zhipeng Zhao, Sunnyvale, CA (US);
Inventors:
Anurag Singla, Cupertino, CA (US);
Zhipeng Zhao, Sunnyvale, CA (US);
Assignee:
HEWLETT PACKARD ENTERPRISE DEVELOPMENT LP, Houston, TX (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 17/30 (2006.01); H04L 29/06 (2006.01); G06F 21/55 (2013.01);
U.S. Cl.
CPC ...
H04L 63/20 (2013.01); G06F 17/30595 (2013.01); G06F 21/552 (2013.01); H04L 63/1416 (2013.01); H04L 63/1425 (2013.01);
Abstract
Fields are determined for pattern discovery in event data. Cardinality and repetitiveness statistics are determined for fields of event data. A set of the fields are selected based on the cardinality and repetitiveness for the fields. The fields may be included in a pattern discovery profile.