The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 27, 2016

Filed:

Dec. 15, 2014
Applicant:

Imec Vzw, Leuven, BE;

Inventors:

Alessio Spessot, Gradisxa D'isonzo, IT;

Moon Ju Cho, Wavre, BE;

Assignee:

IMEC VZW, Leuven, BE;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H03K 3/011 (2006.01); H03K 17/16 (2006.01); H03K 17/14 (2006.01); H03K 17/687 (2006.01); G01R 31/26 (2014.01);
U.S. Cl.
CPC ...
H03K 17/165 (2013.01); G01R 31/2621 (2013.01); H03K 3/011 (2013.01); H03K 17/145 (2013.01); H03K 17/687 (2013.01);
Abstract

A method for at least partially compensating for a change in threshold voltage level of a FET transistor induced by OFF-state stress degradation includes determining a signal indicative of a change in threshold voltage level of the FET with respect to a reference threshold voltage level, and applying a restoration signal to the FET. This restoration signal is adapted for shifting the threshold voltage level of the FET in a direction having opposite sign with respect to the change in threshold voltage level. Applying the restoration signal further includes taking into account the signal indicative of the change in threshold voltage level.


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