The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 27, 2016
Filed:
Feb. 18, 2016
Applicant:
Teledyne Scientific & Imaging, Llc, Thousand Oaks, CA (US);
Inventors:
Sheri Douglas, Newbury Park, CA (US);
Chi Yi Chen, Westlake Village, CA (US);
Jon Ellsworth, Newbury Park, CA (US);
Aristo Yulius, Simi Valley, CA (US);
Gerrit Meddeler, Los Angeles, CA (US);
Assignee:
TELEDYNE SCIENTIFIC & IMAGING, LLC, Thousand Oaks, CA (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H01L 21/00 (2006.01); H01L 27/146 (2006.01);
U.S. Cl.
CPC ...
H01L 27/14698 (2013.01); H01L 27/1463 (2013.01); H01L 27/14687 (2013.01); H01L 27/14696 (2013.01);
Abstract
A method of isolating bad pixels on a wafer comprising the steps of determining physical locations of the bad pixels on the wafer, creating a mask based on the physical locations of the bad pixels, imprinting the mask onto the wafer, and hybridizing the wafer onto a readout integrated circuit (ROIC).