The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 27, 2016

Filed:

Jul. 22, 2010
Applicants:

Mihai G. M. Pop, Lynchburg, VA (US);

Anthony A. Pugh, Forest, VA (US);

Laurence S. Lamanna, Amherst, VA (US);

John T. Willse, Lynchburg, VA (US);

Inventors:

Mihai G. M. Pop, Lynchburg, VA (US);

Anthony A. Pugh, Forest, VA (US);

Laurence S. Lamanna, Amherst, VA (US);

John T. Willse, Lynchburg, VA (US);

Assignee:

AREVA Inc., Lynchburg, VA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01C 17/00 (2006.01); G21C 17/017 (2006.01); G21C 17/06 (2006.01); G21C 19/00 (2006.01); G01N 23/225 (2006.01); G01N 1/04 (2006.01); G01N 1/02 (2006.01);
U.S. Cl.
CPC ...
G21C 17/017 (2013.01); G01N 1/04 (2013.01); G01N 23/225 (2013.01); G21C 17/06 (2013.01); G21C 19/00 (2013.01); G01N 2001/028 (2013.01); G01N 2223/625 (2013.01);
Abstract

A method to perform an analysis of two types of CRUD on a nuclear fuel rod, including providing a nuclear fuel rod with a first and second layer of CRUD on an exterior of the fuel rod; brushing the first layer of CRUD from the fuel rod with a CRUD tool on a selected area; wherein the tool has a brushing device, a force applied to the brushing device on the fuel rod to remove the first layer of CRUD, the force being sufficient enough to perform such removal; collecting the first layer of CRUD from the brushing device, scraping the second layer of CRUD from the fuel rod in the selected area with the tool, wherein the tool has a scraping device and a second force is applied to the tool for scraping, collecting the second layer of CRUD from the scraping device, and analyzing the first layer and second layer of CRUD separately with a scanning electron microscope.


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