The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 27, 2016
Filed:
May. 20, 2015
Sandisk Technologies Inc., Plano, TX (US);
Aaron Lee, Mountain View, CA (US);
Zhenming Zhou, San Jose, CA (US);
Mrinal Kochar, San Jose, CA (US);
Cynthia Hua-Ling Hsu, Fremont, CA (US);
SanDisk Technologies LLC, Plano, TX (US);
Abstract
A storage device with a memory may include read disturb detection for open blocks. An open or partially programmed block may develop read disturb errors from reading of the programmed portion of the open block. The detection of any read disturb effects may be necessary for continued programming of the open block and may include verifying that wordlines in the unprogrammed portion of the open block are in the erase state. A modified erase verify operation for the open block is used in which programmed wordlines are subject to a higher erase verify read voltage, while the unprogrammed wordlines are subject to an erase verify bias voltage.