The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 27, 2016
Filed:
Oct. 27, 2014
Applicant:
Here Global B.v., Veldhoven, NL;
Inventor:
Aaron J. Dannenbring, Chicago, IL (US);
Assignee:
HERE Global B.V., Eindhoven, NL;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G08G 1/09 (2006.01); G08G 1/0967 (2006.01); G01C 21/32 (2006.01); G06F 17/30 (2006.01); G06K 9/00 (2006.01); G08G 1/0962 (2006.01); G01C 21/36 (2006.01);
U.S. Cl.
CPC ...
G08G 1/096783 (2013.01); G01C 21/32 (2013.01); G01C 21/3602 (2013.01); G01C 21/3697 (2013.01); G06F 17/30241 (2013.01); G06K 9/00791 (2013.01); G06K 9/00818 (2013.01); G08G 1/09623 (2013.01); G08G 1/09626 (2013.01);
Abstract
Systems, methods, and apparatuses are described for a negative image or false positive profile for sign locations. Image data or another type of optical data is collected along a path by a collection device such as a camera. The data is analyzed to identify one or more false positive locations along the path at which signs for other paths may be detected. The false positive locations may be described in the negative image or false positive profile. Additional or subsequent optical data may be analyzed based on the negative image or false positive profile may be analyzed to identify at least one confirmed sign position.