The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 27, 2016
Filed:
Dec. 27, 2013
Applicant:
Pictometry International Corp., Rochester, NY (US);
Inventors:
Stephen L. Schultz, West Henrietta, NY (US);
Chris Schnaufer, Rochester, NY (US);
Frank Giuffrida, Honeoye Falls, NY (US);
Assignee:
Pictometry International Corp., Rochester, NY (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H04N 7/18 (2006.01); G06T 3/20 (2006.01); G06T 7/00 (2006.01); G06T 11/60 (2006.01); G06T 17/05 (2011.01);
U.S. Cl.
CPC ...
G06T 3/20 (2013.01); G06T 7/0028 (2013.01); G06T 11/60 (2013.01); G06T 17/05 (2013.01); H04N 7/18 (2013.01); G06T 2207/10032 (2013.01); G06T 2207/30184 (2013.01);
Abstract
A computer system for continuously panning oblique images is disclosed. More particularly, the computer system uses a methodology whereby separate oblique images are presented in a manner that allows a user to maintain an understanding of the relationship of specific features between different oblique images when panning.