The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 27, 2016
Filed:
Mar. 07, 2013
Nikon Corporation, Tokyo, JP;
Gazi Ali, Mountain View, CA (US);
Li Hong, San Diego, CA (US);
Radka Tezaur, Belmont, CA (US);
Mark Takita, Belmont, CA (US);
NIKON CORPORATION, , JP;
Abstract
A method for classifying a test image () includes the steps of building a classifier (), and classifying the test image () with the classifier (). After the test image () is classified, the test image () can be subsequently processed (e.g. deblurred) with improved accuracy. The classifier () can classify and distinguish between PSF features associated with motion blurred images, and PSF features associate with defocus blurred images. The classifier () can be built using a plurality of training images (), and extracting one or more training features from each the training images (). The PSF features can include image moments of the point spread function, and/or geometric features of the point spread function.