The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 27, 2016

Filed:

Jul. 24, 2013
Applicant:

Wipro Limited, Bangalore, IN;

Inventors:

Anoop Rajan, Bellevue, WA (US);

Sourav Bhattacharya, Fountain Hills, AZ (US);

Assignee:

Wipro Limited, Bangalore, IN;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 11/36 (2006.01);
U.S. Cl.
CPC ...
G06F 11/3684 (2013.01); G06F 11/3664 (2013.01); G06F 11/3672 (2013.01); G06F 11/3668 (2013.01); G06F 11/3696 (2013.01);
Abstract

A system, medium and method for automatically generating test data to be applied to test a target software code is disclosed. Input parameter data is received from a user via a displayed user interface, wherein the input parameter data is directed to a user selected data type, the data type being a Boolean, string, or integer. One or more preestablished stored testing algorithms is automatically selected based on the user selected data type and one or more values are applied to the selected one or more preestablished stored testing algorithms in accordance with the user selected data type. At least one set of test data from the one or more identified applicable testing algorithms is automatically generated, wherein the at least one set of test data generated from the identified testing algorithms can be used as inputs for testing the target software code.


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