The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 27, 2016
Filed:
Sep. 18, 2014
Oracle International Corporation, Redwood Shores, CA (US);
Wai Jan, Portland, OR (US);
Gregory Cook, Leicestershire, GB;
R. Bruce Irvin, Portland, OR (US);
Kaj van de Loo, San Francisco, CA (US);
Oracle International Corporation, Redwood Shores, CA (US);
Abstract
Techniques are described for determining diagnostic information (e.g., a diagnostic identifier) for one or more events related to operations performed in a cloud computer system. A diagnostic identifier may be generated based on diagnostic data corresponding to one or more attributes about an event. A computing operation may be performed to generate a code (e.g., a hash code) for each attribute in the diagnostic data. The generated code(s) may be combined to form a diagnostic identifier to identify the diagnostic data. A comparison may be performed by comparing each code in one diagnostic identifier to a code in another diagnostic identifier corresponding to an attribute for which the codes were generated. A measure of a match between the two identifiers may be determined using a result of the comparison. The measure of the match may enable tracing and analysis of one or more events occurring in the cloud computer system.