The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 27, 2016

Filed:

Dec. 26, 2013
Applicant:

Emc Corporation, Hopkinton, MA (US);

Inventors:

Jean-Pierre Bono, Westborough, MA (US);

Dennis T. Duprey, Raleigh, NC (US);

Xiangping Chen, Sherborn, MA (US);

Philippe Armangau, Acton, MA (US);

Monica Chaudhary, South Grafton, MA (US);

Mark K. Ku, Wollaston, MA (US);

Assignee:

EMC IP Holding Company LLC, Hopkinton, MA (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G06F 12/00 (2006.01); G06F 13/00 (2006.01); G06F 13/28 (2006.01); G06F 3/06 (2006.01);
U.S. Cl.
CPC ...
G06F 3/0641 (2013.01); G06F 3/0619 (2013.01); G06F 3/0689 (2013.01);
Abstract

A method is used in managing data deduplication in storage systems based on storage space characteristics. Characteristics of first and second storage tiers are evaluated. A first data object resides on the first storage tier and a second data object resides on the second storage tier. The first and second data objects are selected for applying a deduplicating technique. A data storage system includes the first and second storage tiers configured such that performance characteristics associated with the first storage tier is different from the second storage tier. Based on the evaluation, the deduplicating technique is applied to the first and second data objects.


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