The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 27, 2016
Filed:
Sep. 30, 2013
Applicant:
Uchicago Argonne, Llc, Chicago, IL (US);
Inventors:
Stanislav Stoupin, Willowbrook, IL (US);
Yury Shvydko, Lisle, IL (US);
John Katsoudas, Chicago, IL (US);
Vladimir D. Blank, Moscow, RU;
Sergey A. Terentyev, Moscow, RU;
Assignee:
UChicago Argonne, LLC, Chicago, IL (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01T 1/26 (2006.01); C23C 16/27 (2006.01);
U.S. Cl.
CPC ...
G01T 1/26 (2013.01);
Abstract
An X-ray article and method for analyzing hard X-rays which have interacted with a test system. The X-ray article is operative to diffract or otherwise process X-rays from an input X-ray beam which have interacted with the test system and at the same time provide an electrical circuit adapted to collect photoelectrons emitted from an X-ray optical element of the X-ray article to analyze features of the test system.