The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 27, 2016

Filed:

Aug. 01, 2014
Applicant:

Shenzhen Airdrawing Technology Service Co., Ltd, Shenzhen, CN;

Inventors:

Gui-Zhen Zhang, Shenzhen, CN;

Quan-Long Yang, Shenzhen, CN;

Hung-Jen Tseng, New Taipei, TW;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 35/00 (2006.01); G01R 31/12 (2006.01); G01R 31/00 (2006.01);
U.S. Cl.
CPC ...
G01R 35/00 (2013.01); G01R 31/001 (2013.01);
Abstract

A test system for testing electrostatic testers, is used to test at least one electrostatic tester each including a voltage test terminal and a connection test terminal. The test system includes at least one optical coupler circuit and a chip. Each optical coupler circuit is coupled the voltage test terminal and the connection test terminal of one corresponding electrostatic tester, and each optical coupler circuit converts voltages of the voltage test terminal and the connection test terminal respectively to a voltage test signal and a connection test signal. The chip is couple to the at least one optical coupler circuit, and receives the connection test signal and the voltage test signal produced by the at least one optical coupler circuit, and determines whether the corresponding electrostatic tester connected to each optical coupler circuit is worked normally according to the connection test signal and the voltage test signal.


Find Patent Forward Citations

Loading…