The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 27, 2016

Filed:

Nov. 21, 2011
Applicants:

Helmut Lipp, Dörzbach-Hohebach, DE;

Günter Haas, Mulfingen, DE;

Martin Bürkert, Dörzbach-Hohebach, DE;

Inventors:

Helmut Lipp, Dörzbach-Hohebach, DE;

Günter Haas, Mulfingen, DE;

Martin Bürkert, Dörzbach-Hohebach, DE;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 31/26 (2014.01); G01R 31/28 (2006.01); G01R 31/42 (2006.01); H02M 7/5387 (2007.01);
U.S. Cl.
CPC ...
G01R 31/282 (2013.01); G01R 31/2642 (2013.01); G01R 31/42 (2013.01); H02M 7/53875 (2013.01);
Abstract

An electronic control circuit for an electronically commutated motor (ECM) is disclosed. A plurality of power transistors controls the ECM, and a reference transistor is formed together with the power transistors on a common support. A control unit is configured to, in a test mode: apply a test current to the reference transistor and one of the power transistors respectively; measure a saturation voltage of the reference transistor and one of the power transistors; evaluate a saturation voltage difference between the measured saturation voltages of the reference transistor and the respective power transistor; evaluate a rate of change of saturation voltage differences between a first iteration of the test mode and a second iteration of the test mode; and determine an expected remaining service life of the power transistors based on the temperature of the support during the test mode and the rate of change of the saturation voltage differences.


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