The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 27, 2016

Filed:

Aug. 27, 2010
Applicants:

Toru Mizumoto, Kobe, JP;

Hiroo Tatsutani, Kobe, JP;

Inventors:

Toru Mizumoto, Kobe, JP;

Hiroo Tatsutani, Kobe, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 33/48 (2006.01); G01N 33/50 (2006.01); G01R 23/00 (2006.01); G01N 35/00 (2006.01); G01N 15/14 (2006.01); G01N 35/04 (2006.01);
U.S. Cl.
CPC ...
G01N 35/00623 (2013.01); G01R 23/00 (2013.01); G01N 15/1459 (2013.01); G01N 2035/00653 (2013.01); G01N 2035/0415 (2013.01);
Abstract

An analyzing apparatus comprising a processor of a controller and a memory that stores programs executable by the processor to: receive a test result on a test item from a measurement unit; analyze the test result to determine whether the test result indicates an abnormality on the test item; if the test result is determined to indicate an abnormality on the test item, update a history database in which a history of abnormality determinations made on the test item is recorded; review the history database to determine whether a frequency of abnormality determinations made on the test item exceeds a predetermined frequency for the test item; and if the frequency of abnormality is determined to exceed the predetermined frequency for the test item, alert a user on a possible problem is disclosed. An analyzing method and a non-transitory storage medium are also disclosed.


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