The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 27, 2016
Filed:
Sep. 11, 2012
Applicants:
Ryo Mashita, Kobe, JP;
Hiroyuki Kishimoto, Kobe, JP;
Inventors:
Ryo Mashita, Kobe, JP;
Hiroyuki Kishimoto, Kobe, JP;
Assignee:
SUMITOMO RUBBER INDUSTRIES, LTD., Kobe-Shi, JP;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 23/202 (2006.01); G01N 23/201 (2006.01);
U.S. Cl.
CPC ...
G01N 23/201 (2013.01); G01N 23/202 (2013.01); G01N 2223/106 (2013.01); G01N 2223/1016 (2013.01); G01N 2223/623 (2013.01); G01N 2223/627 (2013.01);
Abstract
The present invention provides a method for evaluating the rebound resilience, hardness, or energy loss of polymer materials, capable of sufficiently evaluating the difference in performance between samples with excellent measurement accuracy. The present invention relates to a method for evaluating the rebound resilience, hardness, or energy loss of a polymer material, including irradiating the polymer material with X-rays or neutrons to perform X-ray scattering measurement or neutron scattering measurement.