The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 27, 2016

Filed:

Feb. 04, 2015
Applicant:

Canon Kabushiki Kaisha, Tokyo, JP;

Inventor:

Shigeki Kato, Shimotsuke, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 21/55 (2014.01); G01N 21/17 (2006.01); G01N 21/57 (2006.01); G01N 21/88 (2006.01); G01N 21/47 (2006.01);
U.S. Cl.
CPC ...
G01N 21/57 (2013.01); G01N 21/4738 (2013.01); G01N 21/55 (2013.01); G01N 21/8806 (2013.01); G01N 2021/1736 (2013.01); G01N 2021/1748 (2013.01); G01N 2021/556 (2013.01); G01N 2201/061 (2013.01); G01N 2201/068 (2013.01); G01N 2201/12 (2013.01);
Abstract

A measuring apparatus includes an illumination device including a surface light source, a detector configured to detect a light intensity distribution formed on a light-receiving surface by reflected light, and a processor configured to obtain the reflection characteristic based on first data of the light intensity distribution detected by the detector. The processor is configured to estimate, based on the first data, second data of a light intensity distribution formed by specular reflected light and third data of a light intensity distribution formed by diffuse reflected light in a case where a point light source is disposed at each position in a light-emitting region of the surface light source, and to estimate, based on the second data and the third data, a light intensity distribution formed by reflected light from the surface.


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