The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 27, 2016

Filed:

Sep. 04, 2014
Applicant:

Atlas Material Testing Technology Gmbh, Linsengericht-Altenhasslau, DE;

Inventors:

Bernd Rudolph, Alzenau, DE;

Peter March, Frankfurt am Main, DE;

Assignee:

ATLAS MATERIAL TESTING TECHNOLOGY GMBH, Linsengericht-Altenhasslau, DE;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 17/00 (2006.01);
U.S. Cl.
CPC ...
G01N 17/004 (2013.01); G01N 17/002 (2013.01);
Abstract

The apparatus for artificially weathering or testing the lightfastness of samples has a weathering chamber, in which at least one sample can be arranged, and a plurality of radiation sources, which are arranged in the weathering chamber and which are operable independently of one another, wherein the apparatus is configured in such a way that the at least one sample is movable on a closed path around the plurality of radiation sources.


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