The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 27, 2016

Filed:

Sep. 27, 2013
Applicant:

Rosemount, Inc., Eden Prairie, MN (US);

Inventor:

Mark Stephen Schumacher, Minneapolis, MN (US);

Assignee:

ROSEMOUNT, INC., Eden Prairie, MN (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01M 99/00 (2011.01); G05B 17/02 (2006.01); G05B 19/418 (2006.01); G05B 23/02 (2006.01);
U.S. Cl.
CPC ...
G01M 99/00 (2013.01); G05B 17/02 (2013.01); G05B 23/0221 (2013.01); G05B 2219/37537 (2013.01);
Abstract

A non-intrusive sensor system includes an array of sensors disposed in a process to measure various input process phenomena and a logic unit that analyses the sensor measurements using an empirical model to produce an estimate of a further process phenomenon not measured directly by any of the array of sensors. The sensors within the array of sensors may be non-intrusive sensors that measure input process phenomena in an intrusive or non-intrusive manner but are non-intrusive with respect to the output process phenomenon as none of these sensors comes into direct contact with the process fluid or process element exhibiting the output process phenomenon. The sensors within the array of sensors can be any type of sensors that produce a measurement of a particular process phenomenon at the same or at different locations within a process.


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