The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 27, 2016
Filed:
May. 09, 2016
Fujitsu Limited, Kawasaki-shi, Kanagawa, JP;
Kazushi Uno, Atsugi, JP;
Fumio Takei, Isehara, JP;
Takeo Kasajima, Machida, JP;
Kyoko Tadaki, Atsugi, JP;
Minoru Ishinabe, Atsugi, JP;
FUJITSU LIMITED, Kawasaki, JP;
Abstract
An abnormality detection system includes an optical fiber, a backscattered light detection unit, and a data processing unit. The detection unit is connected to one end and the other end of the optical fiber and configured to acquire a first intensity distribution of backscattered light by causing light to enter the optical fiber from the one end, and to acquire a second intensity distribution of backscattered light by causing light to enter the optical fiber from the other end. The processing unit is configured to calculate the product of a value obtained by applying a first FIR filter to the first intensity distribution, and a value obtained by applying a second FIR filter to the second intensity distribution, for each of locations on the optical fiber in the length direction thereof, and to determine whether or not abnormality is present based on the result of the calculation.