The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 27, 2016
Filed:
Oct. 12, 2015
Applicant:
Trimble Ab, Danderyd, SE;
Inventor:
Johan Von Matern, Danderyd, SE;
Assignee:
Trimble AB, Danderyd, SE;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01B 11/26 (2006.01); G01C 11/00 (2006.01); G01C 15/00 (2006.01); G01S 5/16 (2006.01); G01B 11/14 (2006.01); G06T 7/00 (2006.01); H04N 7/18 (2006.01);
U.S. Cl.
CPC ...
G01C 15/002 (2013.01); G01B 11/14 (2013.01); G01S 5/163 (2013.01); G06T 7/004 (2013.01); G06T 2200/21 (2013.01);
Abstract
A method for determining position and orientation of a first measuring instrument is disclosed. A second MI and at least one reflective target including a retroreflector unit are arranged in the vicinity of the first MI. At least one imaging module is arranged in the first MI for determining orientation thereof. The at least one imaging module in the first MI can be used in a similar manner as a tracker unit of an optical total station, by way of detecting optical radiation emitted from the second MI and reflected by the at least one TGT.