The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 27, 2016
Filed:
Oct. 15, 2012
Iee International Electronics & Engineering S.a., Echternach, LU;
Norbert Herschbach, Medernach, LU;
IEE International Electronics & Engineering S.A., Echternach, LU;
Abstract
A three-dimensional laser scanner instrument for acquiring three-dimensional geometric data of a scene () comprises an illumination system () for generating a light beam () and for scanning an illumination point of said light beam () through said scene (), a light detection system (-) comprising at least one light detector (), said light detection system being arranged to receive light from said scene (), and an optical system () for imaging light scattered in or reflected from said scene () onto said light detection system (-). The light detection system (-) further comprises a controllable filter element () for dynamically discriminating light impinging from selected regions of said scene () and a control unit () operatively connected to said controllable filter element () and to said illumination system (), wherein in operation of said scanner instrument, said filter element () is controlled by said control unit () so as to guide only light impinging from a selected, spatially delimited region around said illumination point in said scene () onto said at least one light detector ().