The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 27, 2016

Filed:

Jun. 25, 2014
Applicant:

Honda Motor Co., Ltd., Tokyo, JP;

Inventors:

Masatoshi Nishina, Utsunomiya, JP;

Kazuya Iwamoto, Utsunomiya, JP;

Yusuke Takahashi, Utsunomiya, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H02H 9/04 (2006.01); B60L 11/18 (2006.01); H01M 10/42 (2006.01); H01M 10/48 (2006.01); G01R 31/36 (2006.01);
U.S. Cl.
CPC ...
B60L 11/1851 (2013.01); H01M 10/425 (2013.01); H01M 10/486 (2013.01); G01R 31/3606 (2013.01); H01M 2010/4271 (2013.01); Y02T 10/705 (2013.01); Y02T 10/7005 (2013.01);
Abstract

An abnormality detection device includes a temperature detection unit that has a resistor section which varies a resistance value depending on a temperature, a resistance detection unit that detects a resistance value of the resistor section, and a short-circuit unit that short-circuits the resistor section, in which the short-circuit unit short-circuits the resistor section when a predetermined abnormality occurs in a detection target of the temperature detection unit.


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