The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 27, 2016

Filed:

Apr. 23, 2009
Applicants:

Tao Zhao, Sunnyvale, CA (US);

Wenyi Zhao, Mountain View, CA (US);

Daniel J. Halabe, Los Altos, CA (US);

Brian D. Hoffman, Sunnyvale, CA (US);

William C. Nowlin, Los Altos, CA (US);

Inventors:

Tao Zhao, Sunnyvale, CA (US);

Wenyi Zhao, Mountain View, CA (US);

Daniel J. Halabe, Los Altos, CA (US);

Brian D. Hoffman, Sunnyvale, CA (US);

William C. Nowlin, Los Altos, CA (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A61B 5/05 (2006.01);
U.S. Cl.
CPC ...
A61B 34/30 (2016.02); A61B 34/37 (2016.02); A61B 90/94 (2016.02); A61B 2034/2055 (2016.02); A61B 2034/2065 (2016.02); A61B 2090/3937 (2016.02); A61B 2090/3983 (2016.02);
Abstract

The present disclosure relates to systems, methods, and tools for tool tracking using image-derived data from one or more tool-located reference features. A method includes: capturing a first image of a tool that includes multiple features that define a first marker, where at least one of the features of the first marker includes an identification feature; determining a position for the first marker by processing the first image; determining an identification for the first marker by using the at least one identification feature by processing the first image; and determining a tool state for the tool by using the position and the identification of the first marker.


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