The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 27, 2016
Filed:
Jan. 25, 2013
Hitachi Medical Corporation, Tokyo, JP;
Rika Baba, Tokyo, JP;
HITACHI, LTD., Tokyo, JP;
Abstract
Irrespective of the layout, moving path, and moving range of the X-ray source and the detector, a highly precise image is acquired, in a similar manner as an X-ray CT scanner that is capable of acquiring a measured image using a rotation angle of 180 degrees or more. A measured image detected by the detector is converted into a rotationally measured image that is acquired by rotationally moving the X-ray source and the detector along concentric circular paths. Then, the rotationally measured image at every measurement angle is provided with a weight that gives intensity variation equivalent to that of the reconstructed image obtained from the rotationally measured images acquired by the measurement using the rotation angle range of 180 degrees, a reconstruction operation is performed, and a reconstructed image is obtained.