The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 20, 2016
Filed:
Nov. 30, 2015
Applicant:
Mediatek Inc., Hsin-Chu, TW;
Inventors:
Jen-Yang Liu, Taipei, TW;
I-Cheng Tsai, Zhubei, TW;
Hsueh-Wei Chiu, Kaohsiung, TW;
Yuan-Hwui Chung, Tainan, TW;
Chun-Hsien Peng, Xinyi Township, Nantou County, TW;
Assignee:
MEDIATEK INC., Hsin-Chu, TW;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04B 17/00 (2015.01); H04B 17/29 (2015.01);
U.S. Cl.
CPC ...
H04B 17/29 (2015.01); H04B 17/0085 (2013.01);
Abstract
A test/calibration system includes a device under test (DUT) and a calibrated device. The calibrated device is coupled to the DUT, transmits or receives a test signal to or from the DUT in response to a control signal for a test item to test, measure or calibrate functioning or performance of an internal component of the DUT.