The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 20, 2016

Filed:

Sep. 15, 2014
Applicant:

Takahiro Fukase, Kanagawa, JP;

Inventor:

Takahiro Fukase, Kanagawa, JP;

Assignee:

Ricoh Company, Ltd., Tokyo, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06T 7/00 (2006.01); B41F 33/00 (2006.01); G06K 9/03 (2006.01); H04N 1/00 (2006.01);
U.S. Cl.
CPC ...
G06T 7/001 (2013.01); B41F 33/0036 (2013.01); G06K 9/036 (2013.01); G06T 2207/10008 (2013.01); G06T 2207/20021 (2013.01); G06T 2207/30144 (2013.01); H04N 1/00002 (2013.01);
Abstract

An apparatus for verifying an inspection result includes an inspection result obtaining unit to obtain inspection result indicating defect amount and defect position in a scanned image, from an inspection result of defect judgment of the scanned image with respect to an inspection reference image, the defect judgment being performed through dividing at least one of the scanned image and the inspection reference image and conducting position matching of the scanned image and inspection reference image; and a verification unit to count defect amount occurring to the scanned image, to determine whether a defect pattern occurring to the scanned image matches a pre-set condition corresponding to a false detection condition causable by failure of the position matching, and to determine that defect occurring to the scanned image is a false detection when the counted defect amount is a threshold or more, and the defect pattern matches the false detection condition.


Find Patent Forward Citations

Fukase, Takahiro. (2016). Apparatus, system, method and storage medium for image inspection result determination and verifying false defect detections due to position matching errors (U.S. Patent No. 9524545). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/9524545

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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