The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 20, 2016
Filed:
Aug. 08, 2012
Applicant:
Sandra Streckert, Aspach, DE;
Inventor:
Sandra Streckert, Aspach, DE;
Assignee:
EISENMANN AG, Boeblingen, DE;
Primary Examiner:
Int. Cl.
CPC ...
G01M 10/00 (2006.01); G01N 21/88 (2006.01); G01N 21/95 (2006.01); G01N 21/954 (2006.01); G06F 17/15 (2006.01); G06F 17/50 (2006.01); B29C 67/00 (2006.01); B29C 33/38 (2006.01); B05B 12/14 (2006.01); B05B 15/02 (2006.01);
U.S. Cl.
CPC ...
G06F 17/5086 (2013.01); B05B 12/149 (2013.01); B05B 15/02 (2013.01); B29C 33/3842 (2013.01); B29C 33/3857 (2013.01); B29C 67/0055 (2013.01); B29C 67/0059 (2013.01); B29C 67/0062 (2013.01); B29C 67/0066 (2013.01); B29C 67/0077 (2013.01); B29C 67/0081 (2013.01);
Abstract
A method for checking an article with material-free regions, a three-dimensional test structure of the article is set up, this test structure comprising a negative formation of the material-free regions.