The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 20, 2016

Filed:

Jul. 28, 2016
Applicant:

Sas Institute Inc., Cary, NC (US);

Inventors:

Robert N. Bonham, Raleigh, NC (US);

Steven C. Holzworth, Cary, NC (US);

Keefe Hayes, Cary, NC (US);

Assignee:

SAS Institute Inc., Cary, NC (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 11/00 (2006.01); G06F 17/30 (2006.01);
U.S. Cl.
CPC ...
G06F 17/30377 (2013.01);
Abstract

A computing device updates date values in a read dataset to support data analytics. Outlier and non-outlier date values are identified by, for each date value as a respective date value, reading a predefined number of neighboring date values relative to the respective date value; computing a median value and a median absolute deviation value of the predefined number of neighboring date values; computing a difference between the respective date value and the median value; dividing an absolute value of the difference by the median absolute deviation value to define a deviation value; comparing the deviation value to a threshold deviation value; and, based on the comparison, identifying the respective date value as an outlier or a non-outlier date value. Each identified non-outlier date value is updated with a new date computed using a date offset value. Each updated, identified non-outlier date value is replaced in a date updated dataset.


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