The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 20, 2016
Filed:
Sep. 19, 2014
Institut National D'optique, Quebec, CA;
Simon Turbide, Quebec, CA;
INSTITUT NATIONAL D'OPTIQUE, Quebec, Quebec, CA;
Abstract
A method for phase error correction in a synthetic aperture (SA) imaging system is configured to image a target region of a scene from a platform in relative movement with respect to the scene. The method includes acquiring target SA data from the target region and reference SA data from a reference region of the scene, using a SA acquisition unit. One or more phase correction factors are determined from the reference SA data based on an assumption that the reference region has a known topography. The phase correction factors are representative of uncompensated optical-path-length fluctuations along the optical path between the reference region and the SA acquisition unit mounted on the platform. A phase correction is applied to the target SA data based on the phase correction factors so as to obtain phase-corrected target SA data. A SA imaging system implementing the method is also disclosed.