The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 20, 2016
Filed:
Oct. 18, 2013
University of Electronic Science and Technology of China, Chengdu, CN;
Hao Zeng, Chengdu, CN;
Peng Ye, Chengdu, CN;
Kuojun Yang, Chengdu, CN;
Guang Yang, Chengdu, CN;
Qinchuan Zhang, Chengdu, CN;
UNIVERSITY OF ELECTRONIC SCIENCE AND TECHNOLOGY OF CHINA, Chengdu, Sichuan Province, CN;
Abstract
The present invention provides a method for measuring the waveform capture rate of parallel digital storage oscilloscope. On the basis of double pulse measurement, and in consideration of the asymmetry of acquisition and the refreshing time of parallel DSO, the present invention provides a step amplitude-frequency combined pulse measurement to measure the time for waveform acquisition and mapping T, the number of captured waveforms before LCD refreshing Wand the dead time caused by LCD refreshing T, and then calculates the measured average WCR of parallel DSO, according to the measured data, so that the WCR of parallel can be measured.