The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 9523660 B1

PDF
Full Text
Expired
Date of Patent:
Dec. 20, 2016

Filed:

Mar. 31, 2015
Applicants:

Benoit Lepage, Ancienne-Lorette, CA;

Guillaume Painchaud-april, L'Ancienne-Lorette, CA;

Inventors:

Benoit Lepage, Ancienne-Lorette, CA;

Guillaume Painchaud-April, L'Ancienne-Lorette, CA;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 29/30 (2006.01); G01N 29/07 (2006.01); G01N 29/28 (2006.01);
U.S. Cl.
CPC ...
G01N 29/30 (2013.01); G01N 29/07 (2013.01); G01N 29/28 (2013.01); G01N 2291/262 (2013.01);
Abstract

The method for calibrating an inspection instrument coupled with acoustic transducers disposed at circumferential positions distributed around a surface of an elongated object to inspect generally has the steps of: for each one of the circumferential positions, measuring a first and a second received signal using two acoustic transducers disposed at two axial positions along the object, the received signals resulting from the propagation of an acoustic guided wave signal along the object; identifying an acoustic mode according to the first received and the second received signals using a known period of time associated with the propagation of the acoustic guided wave signal between the two axial positions along the object; and determining a coupling coefficient associated with the acoustic mode, the coupling coefficient being indicative of the coupling of the acoustic transducers on the object; and calibrating the inspection instrument coupled to the object based on the coupling coefficients.


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Lepage, Benoit. (2016). Method of conducting probe coupling calibration in a guided-wave inspection instrument (U.S. Patent No. 9523660). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/9523660

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