The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 20, 2016

Filed:

Jan. 06, 2015
Applicants:

Boe Technology Group Co., Ltd., Beijing, CN;

Boe Optical Science and Technology Co., Ltd., Suzhou, CN;

Inventors:

David Yan, Beijing, CN;

Chunlei Cao, Beijing, CN;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 21/00 (2006.01); G01N 21/95 (2006.01); G01N 21/88 (2006.01);
U.S. Cl.
CPC ...
G01N 21/95 (2013.01); G01N 21/8806 (2013.01); G01N 2021/9513 (2013.01); G01N 2201/02 (2013.01); G01N 2201/068 (2013.01);
Abstract

The present invention relates to a backlight inspection equipment comprising a carrying platform configured to dispose a backlight to be inspected and an inspection plate movably disposed relative to the carrying platform. The inspection plate moves from a first position to a second position. When the inspection plate is disposed at the first position, a first light emitting region of the backlight to be inspected is exposed and a second light emitting region which is a region other than the first light emitting region is blocked. When the inspection plate is disposed at the second position, a third light emitting region of the backlight to be inspected, which is different from the first light emitting region, is exposed, and a fourth light emitting region which is a region other than third light emitting region is blocked.


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