The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 20, 2016

Filed:

Apr. 08, 2014
Applicant:

Bae Systems Plc, London, GB;

Inventors:

Ivan Vallejo Veiga, Briston, GB;

Leslie Charles Laycock, Chelmsford-Essex, GB;

Michael Stewart Griffith, Chelmsford-Essex, GB;

Assignee:

BAE SYSTEMS plc, London, GB;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01J 3/28 (2006.01); G01J 3/02 (2006.01);
U.S. Cl.
CPC ...
G01J 3/2823 (2013.01); G01J 3/0208 (2013.01); G01J 3/0237 (2013.01); G01J 2003/2826 (2013.01);
Abstract

There is disclosed a spectral imaging apparatus for processing electromagnetic (EM) radiation, the EM radiation originating from a target scene and comprising a wide range of frequencies, the system comprising: A dispersive element for receiving EM radiation from the target scene and promoting differing amounts of dispersion depending on the frequency of the EM radiation, A deformable lens arranged to receive EM radiation from the dispersive element, An imaging sensor for detecting EM radiation across the wide range of frequencies, and arranged to receive EM radiation from the deformable lens, Wherein the deformable lens is operable to adopt any one of a plurality of focal conditions, each focal condition tending to focus a different range of the EM radiation at the imaging sensor, each focal condition thereby defining a component band for the EM radiation.


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