The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 20, 2016

Filed:

Feb. 23, 2016
Applicant:

Honeywell International Inc., Morris Plains, NJ (US);

Inventors:

Grant A. Gordon, Peoria, AZ (US);

Danny Thomas Kimmel, Phoenix, AZ (US);

Assignee:

Honeywell International Inc., Morris Plains, NJ (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01F 1/48 (2006.01); G01F 1/46 (2006.01);
U.S. Cl.
CPC ...
G01F 1/46 (2013.01);
Abstract

A control circuit for a probe includes: at least one low thermal coefficient resistance (TCR) component placed in a first section of a probe, wherein the at least one low TCR component has low positive temperature resistance coefficient (PTC); at least one high TCR component placed in a second section of the probe and connected in series with the at least one low TCR component, wherein the at least one high TCR component has high PTC, and wherein the at least one high TCR component responds to temperature differently than the at least one low TCR component; and at least one shunt component connected in parallel with the at least one high TCR component, wherein when temperature of the at least one high TCR component exceeds a set temperature point, the at least one shunt component is activated to reduce current flowing through the at least one high TCR component.


Find Patent Forward Citations

Loading…